On-Line Testing for VLSI Michael Nicolaidis

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Published: April 30th 1998

Kindle Edition

161 pages


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On-Line Testing for VLSI  by  Michael Nicolaidis

On-Line Testing for VLSI by Michael Nicolaidis
April 30th 1998 | Kindle Edition | PDF, EPUB, FB2, DjVu, AUDIO, mp3, ZIP | 161 pages | ISBN: | 3.62 Mb

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design ofMoreTest functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today.

The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.



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